Zeiss Auriga Crossbeam FIB-FESEM

Zeiss - AURIGA CrossBeam

SENIC Joint School of Nanoscience and Nanoengineering Joint School of Nanoscience and Nanoengineering

Imaging
- All Imaging
  - FIB

Description

AURIGA CrossBeam consists of a field emission scanning electron microscope (FE-SEM) with GEMINI column accompanied by a Focused Gallium Ion Beam (FIB) column that offers Cross-sectioning, Nanotomography, Nanopatterning, 3D-Analytics, and TEM lamella preparation. Additionally, the system allows for elemental characterization through energy-dispersive X-ray spectroscopy (EDS/EDX).