XCT: Zeiss Xradia 520 Versa X-ray CT
XCT: Zeiss Xradia 520 Versa X-ray CT
Zeiss - Xradia 520 Versa
nano@stanford
Stanford University
Stanford Nano Shared Facilities
- Imaging
- All Imaging
- Other
Description
ZEISS Xradia 520 Versa x-ray microscope (XRM) allows a nondestructive view inside the object. An x-ray microscope uses x-ray radiation to produce magnified images of the objects under investigation. The unique feature of ZEISS Xradia XRM is that it combines geometric magnification together with optical magnification allowing to image larger samples as well as mounting in situ stages.