Wyko Profilometer NT3300
Wyko Profilometer NT3300
Bruker - NT3300
SENIC
Georgia Tech
Institute for Electronics and Nanotechnology Micro/Nano Fabrication Facility
- Metrology/Characterization
- Structure or Device
- Profilometry
Description
The Veeco noncontact profilometer uses the phase change of light reflecting from various heights of similar materials to measure the uniformity of a flat surface or the horizontal distance between two adjacent surfaces.
Features:
-motorized objectives
-motorized stage (tip/tilt & x/y/z)
-upgraded Veeco 'Vision' software w/ additional features
Features:
-motorized objectives
-motorized stage (tip/tilt & x/y/z)
-upgraded Veeco 'Vision' software w/ additional features
Restrictions