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Wyko Profilometer NT3300

Wyko Profilometer NT3300

Bruker - NT3300

SENIC Georgia Tech Institute for Electronics and Nanotechnology Micro/Nano Fabrication Facility
  • Metrology/Characterization
    • Structure or Device
      • Profilometry
Description
The Veeco noncontact profilometer uses the phase change of light reflecting from various heights of similar materials to measure the uniformity of a flat surface or the horizontal distance between two adjacent surfaces.



Features:

-motorized objectives

-motorized stage (tip/tilt & x/y/z)

-upgraded Veeco 'Vision' software w/ additional features
Restrictions
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