Wyko Optical Profilometer
Wyko Optical Profilometer
Wyko - NT9100
RTNN
North Carolina State University
NCSU Nanofabrication Lab (NNF)
- Metrology/Characterization
- Structure or Device
- Profilometry
Description
The Wyko Optical Profilometer can measure the thickness of deposited or etched films via the vertical step-height measurement technique. Surface mapping and roughness can also be characterized. Stitching ability of the tool allows the user to characterize large areas.