Veeco Mulitmode Atomic Force Microscope (AFM)

The Nanoscope IIIa Multimode AFM is primarily used to study the topography of semiconductor surfaces and other materials. It can operate in contact mode or in tapping mode with the capability of achieving resolution ranging from atomic to a few hundred microns. The instrument can be operated in both liquid and air environments. The image analysis and presentation software contains powerful algorithms for the measurement and presentation of research results including: cross sectional analysis, roughness measurement, grain size analysis, depth analysis, power spectral density, histogram analysis, bearing measurement and fractal analysis.