Veeco Dimension 3100 AFM
Veeco Dimension 3100 AFM
Veeco - Dimension 3100 AFM
SDNI
University of California, San Diego
CMRR Materials Characterization Facility
- Metrology/Characterization
- Thin Film
- Mechanical
Description
"The Dimension 3100 AFM is an instrument capable of imaging specimens with a horizontal and vertical resolution down to a fraction of a nanometer. The instrument works by measuring the deflection produced by a sharp tip on micron-sized cantilever as it scans across the surface of the specimen."
Restrictions
Samples up to 150 mm diameter 12 mm thick