ULVAC Deep Oxide Etcher
ULVAC Deep Oxide Etcher
ULVAC - NLD-570
CNS
Harvard University
Center for Nanoscale Systems (CNS)
- Etching
- Dry
- Deep Oxide
Description
ULVAC NLD-570 etch system is designed with low process pressure, high density plasma, low electron temperature which are perfect for the etch applications of deep oxide, LiNbO3, TiO2, quartz, glass, and Pyrex etc. NLD plasma operates in a regime optimal for deep glass and quartz etching with low pressure to eliminate grass or needles at the bottom of features and with high density to enhance etch rate for deep etching. This tool utilizes Controllable Neutral Loop for optimal etch uniformity. The chiller temperature can be adjusted from -20 C to 40 C.
Comments
Applications: The ULVAC NLD-570 tool will be restricted to etch SiO2, TiO2, quartz, glass and LiNbO3 at this moment. Features: -Neutral Loop Discharge high-density plasma system -Fully integrated load lock with automatic wafer transport system -ICP assembly upper electrode powered up to 3,000 W -RF biased lower electrode powered up to 1,000 W and chilled from 40 C to -20 C. -Single wafer loadlock for 6 wafer -Available gases: C3F8, C4F8, CHF3, CF4, O2, Ar, Cl2, and N2 -Internet remote control capability Processes: In general, the etch processes demonstrated vertical profile, high etch rate, good selectivity to metal mask materials, smooth sidewall and clean etched surface. Training: Please contact Kenlin Huang at kenlinhuang@cns.fas.harvard.edu