Tencor P2 Profilometer
Tencor P2 Profilometer
KLA Tencor - P2
nano@stanford
Stanford University
Stanford Nanofabrication Facility
- Metrology/Characterization
- Structure or Device
- Profilometry
Description
The Tencor P2 Long Scan Profiler is a computerized, high-sensitive surface profiler that measures step height and roughness in a variety of applications.
Maximum Substrate Size
6 inch