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TEM: FEI Titan

TEM: FEI Titan

FEI - Titan

nano@stanford Stanford University Stanford Nano Shared Facilities
  • Imaging
    • All Imaging
      • TEM
Description
The Stanford Nano Shared Facilities houses a state-of-the-art FEI 80-300 environmental (scanning) transmission electron microscope with the following capabilities:

Accelerating voltages 80, 200 and 300 kV
High brightness field emission gun (X-FEG)
Monochromator
Spherical aberration corrector in image-forming (objective) lens
Lorentz lens for imaging magnetic samples
Low-dose exposure technique
TEM and STEM tomography
Biprism for electron holography
Energy-dispersive X-ray spectroscopy (EDS) with Oxford Xmax SDD Detector
Electron-energy loss spectroscopy (EELS) and Dual EELS with Gatan Quantum 966 EEL spectrometer
Energy-Filtered TEM imaging
Environmental mode which allows gases to be introduced into the otherwise high vacuum of the TEM column (Guidelines on gases and gas pressures available)
Instrument Resolution:

Image resolution (TEM mode): 0.07 nm
Probe resolution (STEM mode): 0.14 nm (at 300kV)
Energy resolution: ~ 1 eV (monochromator off), 0.1 eV (monochromator on)
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