TEM: FEI Tecnai
TEM: FEI Tecnai
FEI - Tecnai G2 F20 X-TWIN
nano@stanford
Stanford University
Stanford Nano Shared Facilities
- Imaging
- All Imaging
- TEM
Description
The FEI Tecnai G2 F20 X-TWIN Transmission Electron Microscope has a field-emission gun (FEG), scanning unit (STEM) with bright field/dark field detector, x-ray detector (EDS) for compositional analysis and CCD camera.
The Tecnai's specifications are as follows:
2.5 point-to-point resolution, 1.02 line resolution, 1.4 information limit
200kV operating voltage
30 tilt with double-tilt holder, 80 tilt with tomography holder (expected mid-2010)
EDAX SUTW (super ultra thin window) and analyzer, 0.3 srad EDS solid angle
The instrument is run using the TIA interface, and additional software includes: Gatan Digital Micrograph (TIA-embedded version), Xplore3D (tomography package with data acquisition, Inspect3D, ResolveRT (FEI edition)), TrueImage (focal series reconstruction), Gatan HoloWorks, Adobe Photoshop, MacTempas (image calculation), Desktop Microscopist (crystallographic analysis), and ImageJ (image processing). Further, the Tecnai is integrated into our Collaboratory remote access system.
The Tecnai's specifications are as follows:
2.5 point-to-point resolution, 1.02 line resolution, 1.4 information limit
200kV operating voltage
30 tilt with double-tilt holder, 80 tilt with tomography holder (expected mid-2010)
EDAX SUTW (super ultra thin window) and analyzer, 0.3 srad EDS solid angle
The instrument is run using the TIA interface, and additional software includes: Gatan Digital Micrograph (TIA-embedded version), Xplore3D (tomography package with data acquisition, Inspect3D, ResolveRT (FEI edition)), TrueImage (focal series reconstruction), Gatan HoloWorks, Adobe Photoshop, MacTempas (image calculation), Desktop Microscopist (crystallographic analysis), and ImageJ (image processing). Further, the Tecnai is integrated into our Collaboratory remote access system.