SPM: Park XE-70

We have two Park Systems scanning probe microscopes, an XE-70 and an XE-100. Unlike conventional tube scanner technology, the Park systems feature decoupled flexure-guided X, Y and Z scanners with zero background curvature. The Z-servo response is also considerably higher than that of conventional tube scanners, thus enabling true Non-Contact mode. The machine accommodates samples up to 100 mm in diameter and has a maximum scan size of 50 X 50 _m (5 X 5 _m in low-voltage mode). The Z range is 12 _m (1.7 _m in low-voltage mode). The XE-70 setup includes direct on-axis optics with manual Z focus stage. Additionally, the XE-100 has automated Z control with the Focus Follow feature.