Scanning Electron Microscope with EDS

JEOL's JSM-6010LA InTouchScopeTM Scanning Electron Microscope (SEM) is an analytical, low vacuum SEM featuring integrated Energy Dispersive Spectroscopy (EDS) with the latest Silicon Drift Detector (SDD) technology. The JSM-6010LA has the capability of qualitative and quantitative elemental analysis using simultaneous multiple live image and movie capture. The system also comes equipped with an infrared chamberscope and a 6 inch wafer stage.