Rigaku SmartLab X-Ray Diffractometer
Rigaku SmartLab X-Ray Diffractometer
Rigaku - SmartLab
RTNN
North Carolina State University
Analytical Instrumentation Facility
- Metrology/Characterization
- Thin Film
- XRD
Description
X-ray diffraction (XRD) is one of the most important characterization tools used in solid state
chemistry and materials science, which could provide most definitive structural information (e.g.
interatomic distances, bond angles, and crystallinity). Rigaku SmartLab X-ray diffractometer is capable of performing X-ray reflectivity technique on
thin films, which provide the information of film thickness, roughness, and density. The PANalytical Empyrean allows analyses under a variety of in situ conditions.
chemistry and materials science, which could provide most definitive structural information (e.g.
interatomic distances, bond angles, and crystallinity). Rigaku SmartLab X-ray diffractometer is capable of performing X-ray reflectivity technique on
thin films, which provide the information of film thickness, roughness, and density. The PANalytical Empyrean allows analyses under a variety of in situ conditions.