Renishaw inVia Confocal Raman Microscope (UV-IR)
Renishaw inVia Confocal Raman Microscope (UV-IR)
Renishaw - inVia
SENIC
Georgia Tech
Materials Characterization Facility
- Imaging
- All Imaging
- Confocal
- Metrology/Characterization
- Chemical Analysis
- Spectroscopy
Description
The Renishaw InVia Confocal Raman Microscope features a 266 nm laser line, with variable power from .000001% to 100%.
- High confocal depth resolution.
- UV-Si and InGaAs detectors that allow PL and Raman spectra from 266 nm - 1700 nm.
- High confocal depth resolution.
- UV-Si and InGaAs detectors that allow PL and Raman spectra from 266 nm - 1700 nm.
Maximum Substrate Size
3 inch