Panalytical X'Pert PRO MRD XRD
Panalytical X'Pert PRO MRD XRD
PANalytical - MRD
SENIC
Georgia Tech
Materials Characterization Facility
- Metrology/Characterization
- Thin Film
- XRD
Description
The X'Pert PRO MRD diffraction system is a complete system for all types of crystallographic structure analysis. Applications this instrument is capable of include: rocking curve analysis, reciprocal space mapping, reflectometry, thin film phase analysis, residual stress, texture analysis, and small angle x-ray scattering (SAXS)..