NewView 7300 3D Optical Surface Profiler
NewView 7300 3D Optical Surface Profiler
Zygo - NewView 7300
MANTH
University of Pennsylvania
Singh Center for Nanotechnology
- Metrology/Characterization
- Structure or Device
- Optical
Description
The NewView 7300 white light interferometer (profilometer) is a powerful tool for characterizing and quantifying surface roughness, step heights, critical dimensions, and other topographical features with excellent precision and accuracy. All measurements are nondestructive, fast, and require no sample preparation. Profile heights ranging from < 1 nm up to 10000 m at high speeds, independent of surface texture, magnification, or feature height.
Using ZYGOs Coherence Scanning Interferometry (CSI) technology, the NewView 7300 3D optical surface profiler easily measures a wide range of surfaces, including smooth, rough, flat, sloped, and stepped surfaces.
Key Features:
Fast non-contact measurements
Sub-angstrom Z resolution
Leading-edge precision & gage capability
Enhanced optical imaging
Using ZYGOs Coherence Scanning Interferometry (CSI) technology, the NewView 7300 3D optical surface profiler easily measures a wide range of surfaces, including smooth, rough, flat, sloped, and stepped surfaces.
Key Features:
Fast non-contact measurements
Sub-angstrom Z resolution
Leading-edge precision & gage capability
Enhanced optical imaging
Maximum Substrate Size
8 inch