Nanospec Reflectometer - Inorganic
Nanospec Reflectometer - Inorganic
Nanometrics - NanoSpec 3000
SENIC
Georgia Tech
Institute for Electronics and Nanotechnology Micro/Nano Fabrication Facility
- Metrology/Characterization
- Thin Film
- Thickness
Description
The NanoSpec 3000 is a film thickness measurement system that utilizes a modern small spot spectroscopic reflectometer that is built on a simple-to-use tabletop platform.
Restrictions