LEO (Zeiss) 1550 Field Emission SEM
LEO (Zeiss) 1550 Field Emission SEM
Zeiss - LEO 1550
NanoEarth
Virginia Tech
Nanoscale Characterization and Fabrication Lab (NCFL)
- Imaging
- All Imaging
- SEM
Description
The LEO (Zeiss) 1550 is a high-performance Schottkyfield-emission SEMcapable of resolution in 2-5 nm size range. It is used for high-resolution imaging of surfaces, qualitative assessment of the distribution of elements (with atomic numbers between boron and uranium), submicron structure analysis, and determination of crystal orientation and crystalline texture.