JEOL JSM-7400F Field Emission Scanning Electron Microscope
JEOL JSM-7400F Field Emission Scanning Electron Microscope
JEOL - JSM-74000F
SDNI
University of California, San Diego
CMRR Materials Characterization Facility
- Imaging
- All Imaging
- SEM
Description
This high resolution SEM is ideal for both imaging and analysis of nanostructures, and determining chemical composition of the sample through X-ray spectroscopy. By combining large beam currents with a small probe size at ANY accelerating voltage, the JEOL JSM-7400F dramatically increases analytical resolution to the sub 100nm scale.