JEOL 100 CX-II TEM
JEOL 100 CX-II TEM
JEOL - 100CX-II
SENIC
Georgia Tech
Materials Characterization Facility
- Imaging
- All Imaging
- TEM
Description
Transmission electron microscope for very high resolution imaging approaching at the atomic scale. 100 kV TEM, for conventional imaging and education. Large degree (65) of tilt for crystal studies.