J.A. Woollam M2000 Spectroscopic Ellipsometer
J.A. Woollam M2000 Spectroscopic Ellipsometer
J.A. Woollam - M2000
nano@stanford
Stanford University
Stanford Nanofabrication Facility
- Metrology/Characterization
- Thin Film
- Thickness
Description
The Woollam M2000 is a spectrometer which will measure phase changes in polarized light to estimate the thickness and optical constants of films.
Maximum Substrate Size
8 inch