Horiba Raman/AFM
Horiba Raman/AFM
Horiba
MANTH
University of Pennsylvania
Singh Center for Nanotechnology
- Metrology/Characterization
- Thin Film
- Spectroscopy
- Imaging
- All Imaging
- Probe
Description
Capabilities: Raman spectroscopy and photoluminescence in transmission and reflection modes. Scanning sample stage for mapping of optical properties Side-illumination for integrated contact and tapping AFM, scanning surface potential, and tip-enhanced Raman spectroscopy. Cryogenic vacuum sample holder with electrical feedthroughs. 405 nm, 600nm, and 785nm laser sources 600/mm and 1800/mm diffraction gratings.
Maximum Substrate Size
2 inch