HITACHI 4100 Spectrophotometer

Hitachi - U4100

NCI-SW Arizona State University Advanced Electronics and Photonics Core Facility

Imaging
- All Imaging
  - Optical

Description

Using the software UV-Solutions the measurements are taken on a overall wavelength range from 240nm to 2,600nm. It also performs measurements of diffuse reflectance and variable angle absolute reflectance on a incident angle from 20 to 60 degrees.

Maximum Substrate Size

4 inch

Comments

Tool can accommodate square 156mm x 156mm solar wafers