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Filmetrics F40-UV

Filmetrics F40-UV

Filmetrics - F40-UV

CNF Cornell University Cornell NanoScale Science & Technology Facility (CNF)
  • Metrology/Characterization
    • Thin Film
      • Other
Description
The Filmetrics F40-UV is an interferometer capable of single point thickness measurement of transparent films on any substrate size. A UV light source enables accurate measurement of films as thin as 4 nm with a spot size of 25 um.
Maximum Substrate Size
12 inch
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