Filmetrics F40-UV
Filmetrics F40-UV
Filmetrics - F40-UV
CNF
Cornell University
Cornell NanoScale Science & Technology Facility (CNF)
- Metrology/Characterization
- Thin Film
- Other
Description
The Filmetrics F40-UV is an interferometer capable of single point thickness measurement of transparent films on any substrate size. A UV light source enables accurate measurement of films as thin as 4 nm with a spot size of 25 um.
Maximum Substrate Size
12 inch