FESEM Ultra55
FESEM Ultra55
Zeiss - Ultra 55
CNS
Harvard University
Center for Nanoscale Systems (CNS)
- Imaging
- All Imaging
- SEM
Description
The Ultra55 Field Emission Scanning Electron Microscope (FESEM) allows surface examination down to nanometer scales. The SEM uses a low to moderate energy (0.1 to 30 keV) electron beam to image a sample in high vacuum with resolutions down to 1 nanometer at 15 keV and 1.7 nm at 1 keV.