FEI Titan 300
FEI Titan 300
FEI - Titan 80-300
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NanoEarth
Virginia Tech
Nanoscale Characterization and Fabrication Lab (NCFL)
- Imaging
- All Imaging
- TEM
Description
The FEI TITAN 80-300 is a field emission analytical electron microscope especailly for small electron probe based techniques, including STEM-HAADF imaging and high spatial resolution EELS and EDS. The microscope has a robust column structure, improving image stability at higher magnification. Typical applications are i) chemical and structural analysis of a wide range of materials in nanoscale (materials must be high vacuum compatible) and ii) high-resolution imaging including energy-filtered imaging. The TEM is used for research/research education and access to this TEM is limited to experienced users.