FEI Tecnia Osiris
FEI Tecnia Osiris
FEI - Osiris
NNF
University of Nebraska-Lincoln
Nebraska Center for Materials and Nanoscience (NCMN)
- Imaging
- All Imaging
- TEM
Description
The Tecnai OsirisTM is a fully digital 200 kV S/TEM system, designed to deliver revolutionary analytical performance and outstanding quality in TEM and STEM imaging. Tecnai Osiris introduces for the first time the unique ChemiSTEMTM technology which combines technical advances in beam generation with disruptive changes in EDX signal detection. ChemiSTEM comprises the proprietary X-FEG high brightness electron source and Super-X, FEIs new EDX detection system based on Silicon Drift Detector (SDD) technology, and achieves a factor of more than 50 enhancement in acquisition speed of EDX chemical mappings. With ChemiSTEM the collection time for elemental maps in fast mapping mode can be reduced from hours to minutes or from minutes to seconds, compared to standard solutions. This gain in speed can also be used to collect EDX elemental mappings from larger field-of-view in similar times, compared to standard solutions.