FEI Tecnai F30 TEM
FEI Tecnai F30 TEM
FEI - Tecnai F30
SENIC
Georgia Tech
Materials Characterization Facility
- Imaging
- All Imaging
- TEM
- Metrology/Characterization
- Thin Film
- EDS/WDS
Description
Thermally-assisted field emission (TFE) gun, may be operated at 80, 200, 300 kV. TEM Point resolution: 2.0 , TEM resolution limit 1.02 , STEM HAADF resolution: 0.17 nm. Thin window EDS spectrometer for quantitative nanoanalysis. Lorenz lens, electron holography Biprism, Gatan GIF system (Tridiem 863 UHS). Sample holders: CompuStage Single-tilt Holder CompuStage Low-background Double-tilt Holder Tomography Holder (High Field of View) Gatan Heating Holder Gatan Cryo-holder Attachments: Lorenz lens, Holography wire, Gatan GIF Tridiem 863
Comments
Gatan EELS, EDS