Digital Instruments Nanoscope 3000 AFM

Atomic Force and scanning tunneling scanning modes: contact, tapping, non-contact, liftmode, force modulation, lateral force microscopy, magnetic force microscopy, phase imaging, scanning capacitance, lithography, electric force micrscopy. Integrated top-view color video optics with motorized zoom and 1.5 m optical resolution. X-Y stage that provides substantially better positioning repeatability - 3m unidirectional and 4-6m bidirectional. Little or no sample preparation for increased productivity. Easily changes among all AFM/STM scanning modes/techniques without tools