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Dektak 6M Profilometer

Dektak 6M Profilometer

Veeco/Dektak - 6M

CNF Cornell University Cornell NanoScale Science & Technology Facility (CNF)
  • Metrology/Characterization
    • Structure or Device
      • Profilometry
Description
Profilometry allows users to get a 2D trace of surface topographic features through contact with a stylus. The Dektak profilometer determines film thickness, feature heights in microfluidic devices, 3D-printed devices or feature depths in laser cut samples. It can also show the surface roughness of substrates.
Maximum Substrate Size
6 inch
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