Dektak 6M Profilometer
Dektak 6M Profilometer
Veeco/Dektak - 6M
CNF
Cornell University
Cornell NanoScale Science & Technology Facility (CNF)
- Metrology/Characterization
- Structure or Device
- Profilometry
Description
Profilometry allows users to get a 2D trace of surface topographic features through contact with a stylus. The Dektak profilometer determines film thickness, feature heights in microfluidic devices, 3D-printed devices or feature depths in laser cut samples. It can also show the surface roughness of substrates.
Maximum Substrate Size
6 inch