Dage X-Ray XD7600NT
Dage X-Ray XD7600NT
Nordson DAGE - XD7600NT
SENIC
Georgia Tech
Institute for Electronics and Nanotechnology Micro/Nano Fabrication Facility
- Metrology/Characterization
- Structure or Device
- Other
Description
The Dage X-Ray XD7600NT provides the highest resolution and largest X-ray images for failure analysis with oblique angle views up to 70 degrees, displayed at full 2 Mpixel resolution on screen.
-750nm (0.75 micron) feature recognition
-Revolutionary filament-free Dage NT X-ray tube
-AXIS Active Image Stabilisation
-XiDAT 2.0 imaging chain
-Up to 70 degree oblique angle views over the entire inspection area
-Enhanced automated inspection routines
-Automatic BGA and die-void measurements
-Comprehensive data logging and reporting facilities
-Uninterrupted rotating live oblique views 360 degrees around any point in the sample
-750nm (0.75 micron) feature recognition
-Revolutionary filament-free Dage NT X-ray tube
-AXIS Active Image Stabilisation
-XiDAT 2.0 imaging chain
-Up to 70 degree oblique angle views over the entire inspection area
-Enhanced automated inspection routines
-Automatic BGA and die-void measurements
-Comprehensive data logging and reporting facilities
-Uninterrupted rotating live oblique views 360 degrees around any point in the sample