Bruker EDS
Bruker EDS
Bruker - QUANTAX 200
CNF
Cornell University
Cornell NanoScale Science & Technology Facility (CNF)
- Metrology/Characterization
- Thin Film
- EDS/WDS
Description
The Bruker QUANTAX 200 Energy Dispersive X- ray Spectrometer (EDS) with XFlash6 silicon drift detector is a modular EDS system for qualitative and quantitative microanalysis. The systems standard-less quantification software enables manual, automatic or interactive spectra evaluation and provides reliable results for specimens with polished or irregular surfaces, thin layers and particles. This unit is attached to the Zeiss Supra 55 SEM
Maximum Substrate Size
6 inch