Bruker Dimension Icon AFM
Bruker Dimension Icon AFM
Bruker Corporation - Atomic Force Microscope
SHyNE Resource
The University of Chicago
Pritzker Nanofabrication Facility (PNF)
- Imaging
- All Imaging
- Probe
Description
The Bruker Dimension Icon AFM (Atomic Force Microscope) is a very high resolution scanning microscope used in scanning microscopy (SPM) which produces three dimensional images. It is used for nanoscale surface topography, nano-mechanical, nano-electircal, and nano-scale chemical mapping, and morphology measurement.
Maximum Substrate Size
6 inch