Bruker AXS General Area Detector Diffraction System
Bruker AXS General Area Detector Diffraction System
Bruker
RTNN
North Carolina State University
Analytical Instrumentation Facility
- Metrology/Characterization
- Thin Film
- XRD
Description
X-ray diffraction (XRD) is one of the most important characterization tools used in solid state
chemistry and materials science, which could provide most definitive structural information (e.g.
interatomic distances, bond angles, and crystallinity). Bruker AXS General Area Detector Diffraction System (GADDS) at AIF equipped with a HighStar
area detector and a Four-circle Eulerian cradle that allow for rapid analysis of polycrystalline
and single crystalline samples, texture in the samples, and coarse-grained materials.
chemistry and materials science, which could provide most definitive structural information (e.g.
interatomic distances, bond angles, and crystallinity). Bruker AXS General Area Detector Diffraction System (GADDS) at AIF equipped with a HighStar
area detector and a Four-circle Eulerian cradle that allow for rapid analysis of polycrystalline
and single crystalline samples, texture in the samples, and coarse-grained materials.