Asylum MFP-3D atomic force microscope
Asylum MFP-3D atomic force microscope
Asylum Research - MFP-3D
MANTH
University of Pennsylvania
Singh Center for Nanotechnology
- Imaging
- All Imaging
- Probe
Description
Modes available
Contact, AC (tapping) and Dual AC, 1-D forces, lateral force, nanolithography, Electrostatic Force, Kelvin probe, conductive AFM, Magnetic Force, piezoelectric force, thermal AFM
Scan axes
90_m x 90_m _ 15_m closed loop
Z noise
<0.06nm 0.1Hz-1kHz BW
Cantilever noise
<0.02nm Adev, 0.1Hz-1kHz BW.
Analog to Digital Converters
One 16-bit, 5 MHz channel
Digital to Analog Converters
Five 16-bit 100kHz channel
Direct Digital Synthesizer
Six 24-bit 100kHz channels, plus two 10-bit 10MHz summed on a singleDAC
Applications: Force curves in contact or AC modes, frictional force imaging. Nanolithography, electrostatic force microscopy, and scanning surface potential. Conductive AFM, magnetic and piezoresponse force microscopy.
Contact, AC (tapping) and Dual AC, 1-D forces, lateral force, nanolithography, Electrostatic Force, Kelvin probe, conductive AFM, Magnetic Force, piezoelectric force, thermal AFM
Scan axes
90_m x 90_m _ 15_m closed loop
Z noise
<0.06nm 0.1Hz-1kHz BW
Cantilever noise
<0.02nm Adev, 0.1Hz-1kHz BW.
Analog to Digital Converters
One 16-bit, 5 MHz channel
Digital to Analog Converters
Five 16-bit 100kHz channel
Direct Digital Synthesizer
Six 24-bit 100kHz channels, plus two 10-bit 10MHz summed on a singleDAC
Applications: Force curves in contact or AC modes, frictional force imaging. Nanolithography, electrostatic force microscopy, and scanning surface potential. Conductive AFM, magnetic and piezoresponse force microscopy.