Agilent PicoPlus atomic force microscope
Agilent PicoPlus atomic force microscope
Agilent Technologies/ Keysight Technologies - 5500
MANTH
University of Pennsylvania
Singh Center for Nanotechnology
- Imaging
- All Imaging
- Probe
Description
Range
90_m _ 90 _m _ 7 _m closed-loop scanner
9 _m _ 9 _m _ 2 _m open loop scanner
Noise floor
<5 A_ (large scanner)
<1 A_ (small scanner)
Controller
Ten 16-bit channels input
Four 24-bit channels out
Modes
Contact, tapping, lateral force, force spectroscopy, SKPM, MAC and Top MAC
Environment
Ambient, purged gas, fluid
Applications: Controlled-environment AFM (fluid, purged gas, temperature- programmed). Polymers, electrochemistry, force spectroscopy. Magnetically- excited AFM.
90_m _ 90 _m _ 7 _m closed-loop scanner
9 _m _ 9 _m _ 2 _m open loop scanner
Noise floor
<5 A_ (large scanner)
<1 A_ (small scanner)
Controller
Ten 16-bit channels input
Four 24-bit channels out
Modes
Contact, tapping, lateral force, force spectroscopy, SKPM, MAC and Top MAC
Environment
Ambient, purged gas, fluid
Applications: Controlled-environment AFM (fluid, purged gas, temperature- programmed). Polymers, electrochemistry, force spectroscopy. Magnetically- excited AFM.