Walter Henderson
Job Title
Senior Research Scientist
Phone
404-894-4702
Degree/Discipline
M.S./Physics
Site
SENIC
Facility
Materials Characterization Facility
Expertise
Analysis of materials and devices by Surface Science (SIMS & XPS), Scanning Probe Microscopy (AFM and nanoindentation), Spectroscopy (Raman and FTIR). Background in growth and characterization of compound semiconductors
Publications
